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GEN-AMB-ALN-C5.8oz-LS2/25mil

  • Substrate Material: Aluminum Nitride (AlN)
    Process Type: AMB (Active Metal Brazing)
    Structure: 2-layer (Double-sided Copper)
    Board Thickness: 0.635 mm (≈25 mil)
    Copper Thickness: 200 μm per side (≈7.87 mil / ~5.8 oz/ft²)
    Surface Finish: Double-side Polished Copper
    Dimensions: 40.95 mm × 21.4 mm

    Advantages:

    • High thermal conductivity

    • Excellent bonding surface

    • Suitable for high-voltage, high-current modules

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This high-performance aluminum nitride (AlN) ceramic substrate is manufactured using Active Metal Brazing (AMB) technology. Designed with a double-layer structure, it offers robust electrical interconnection and high thermal conductivity, making it an ideal choice for power semiconductor modules.

The substrate has a thickness of 0.635 mm (25 mil), with copper layers of 200 μm (≈7.87 mil, approx. 5.8 oz/ft²) on both sides. The copper surfaces are double-side polished to ensure excellent flatness and high bondability, suitable for high-power applications.

With compact dimensions of 40.95 mm × 21.4 mm, this substrate is especially well-suited for automotive and industrial IGBT modules or other applications requiring high reliability and thermal performance.